Compact InGaAs Linescan Camera for Machine Vision
The model 1024-LDM camera is a high-speed 1024-pixel linescan InGaAs camera for use in high-resolution imaging through silicon wafers, blocks or ingots.
The 1024-LDM Linescan Camera finds problems such as mis-alignment, occlusions, inclusions or cracks; before the expense of further processing of ICs or solar cells. High-speed imaging of free-falling molten glass gobs, agricultural raw materials, or pharmaceutical mixes also benefit from the camera’s flexible line rates of up to 45,956 lps. Only 2.4 inches in depth, the mechanical design gives system integrators the flexibility to fit the camera inside their inspection machines. The LDM provides 14-bit digital capture into base-format Camera Link® interface cards, while providing dynamic ranges up to 4500:1. A photoetch mask sharply defines the array’s 25-µm aperture, ensuring high time and spatial resolution; the alternate 500-µm pixel height trades time resolution for increased sensitivity in photoluminescence imaging.
6.1 cm x 7.37 cm x 7.62 cm
2.4 in x 2.9 in x 3.00 in
Length excludes I/O connectors, and lens adapter
< 450 g or 1 lbs (no lens or adapter)
M42x1-6H with 5.7 mm to image plane
one, fixed distance C-Mount adapter or
adjustable distance F-Mount adapter (see ordering info)
4 tapped 8-32 holes in 2 inch square pattern
4 tapped M4x0.7-6H holes spaced 5 cm x 4 cm (h x w)
O-Ring light seal, 1.9 inch diameter, 1/16th thickness
2 tapped ¼-20 holes alternating on ¾” (19 .05 mm) spacing with 2 tapped M6-6H holes
4 tapped M4x0.7-6H holes, 5 x 4.5 cm spacing (h x d)
-10°C to +50°C
- 20°C to 70°C
Non-condensing
AC Adapter: 100-240 VAC, 47-63 Hz, < 1.0 A
DC Voltage: 7-16 V, < 6 W at 25°C, <9 W at 50°C
In-rush Current: < 1.5 A peak
SDR 26-pin connector ( Base Camera Link®)
SDR 26-pin connector ( Base Camera Link®)
Hirose HR10-7R-6PA receptacle
Mates with HR10-7P-6S or SN4-8-6(P)
SMA: 5 V, 50 W series terminated,
active high: integration active
SMA, Low < 0.5, 3 V > high < 5 V
Green: TEC locked at setpoint
Red: TEC unlocked
Blinking: Timing or triggering error
Meets class A level for emission, immunity & ESD standards
Meets requirements for Part 15, Subpart B, Class A, 2006
1024 pixels on 25 μm pitch with 4 readout ADCs
500 μm or 25 μm (square pixel sharply defined by mask on detector surface)
> 70%
0.1 pF | 1.0 pF | 10.0 pF |
Typical | Specification | Typical | Specification | Typical | Specification | |
Net full well capacity (Me-) 2 | 1.6 | >1.1 | 15.9 | >9.2 | 150 | >110 |
Gain (e-/cnt) 1,3 | 107 | 1000 | 9600 | |||
Temporal noise (rms counts) 1,2 | 8 | <10 | 3.5 | <4.5 | 2.5 | <3.5 |
Dynamic range 1,2,4 | 1900:1 | >1350:1 | 2600:1 | >2100:1 | 3100:1 | >2600:1 |
Differential non-linearity 1,2 | +/- 0.8% | < +/- 1.2% | +/- 0.8% | < +/- 1.2% | +/- 0.8% | < +/- 1.5% |
White, dark, noisy or pixels exceeding +/- 10 of the mean value when illuminated at 50% of full well. Number of bad pixels limited to a maximum of 1% of array total; no bad neighbors within 5 pixels
0.018 ms to 12.8 ms in 20 preset steps or to > 1 s with user programmed or via the width of the ext. trigger
Free run, single line per trigger, external variable exposure, or gated burst
SMA coaxial connector: digital output signal, high during integration
Via frame grabber CC1 signal or SMA coaxial connector on rear panel with selectable polarity
User set by the duration of trigger signal (minimum ET pulse: 10 μs)
+/-1 clock cycle: nominally 80 ns with internal ET
50 Mpix/s max with 14-bit words transferred on each Camera Link strobe clock cycle
14-bit base Camera Link®; recommend NI PCIe-1427 or equivalent frame grabber
Integrate while read, differential double sampling
Factory calibrated gain, offset, and bad pixel replace, applicable to the center 90% of the array
1024 x 1
25 μm
45,956 lps
0.8 to 1.7 μm
1 Actual formats and performance governed by user-selected SUI linear array purchased with camera (dark current may limit longest usable ET)
2 Camera readout noise limited for low & medium gain settings; dark shot noise limited for high gain settings
3User selectable by command over Camera Link® serial lines
4Dynamic range limited to maximum values shown when camera operated at exposure times shorter than 28 μs due to reduced full well capacity
Camera Model1 | Part number | Max. Line rate1 | Pitch | Pixels | FPA length | Aperture (height) |
SU1024-LDM-1.7RT-0025/LC | 8000-0555 | >46,956 lps | 25 μm | 1024 | 25.6 mm | 25 μm |
SU1024-LDM-1.7RT-0500/LC | 8000-0661 | >46,956 lps | 25 μm | 1024 | 25.6 mm | 500 μm |
1Cameras include the photodiode array, whose characteristics dominate camera performance; see the array datasheet for more information
2Accessory Kits: Include power supply, carrying case, SMA-BNC trigger in and sync out cables, o-ring, carrying case, mini-CD with manual and free SUI Image Analysis software for National Instruments Camera Link frame grabbers.
3Part Numbers: Kit with F-mount adapter: 8000-0528. Kit with C-mount: 8000-0530. Kit without lens adapter: 8000-0529
These commodities, technology and/or software are subject to the Export Administration Act as promulgated by the Export Administration Regulations. Diversion contrary to U.S. law is prohibited.
1024-LDM Linescan Camera | ||
Export Classification: | EAR EAR99 | |
1024-LDM Linescan Camera - Square Pixel | ||
Export Classification: | EAR6A003.b.4.a |
RTX does not assume any liability that should arise from the provision of this information in connection with national customs laws and regulations or other international trade requirements.
We enable placement of cookies on your browser to improve your experience with us. By closing this banner or interacting with our site, you permit us to recognize our cookies and our partners' and identify you for marketing.